Title :
Optical frequency domain reflectometry for high-resolution distributed strain sensing
Author :
Bos, Joseph J. ; Gifford, Dawn K. ; Sang, Alex K. ; Froggatt, Mark E.
Author_Institution :
A Div. of Luna Innovations Inc., Luna Technol., Blacksburg, VA, USA
Abstract :
Commercially available OFDR technology provides high-resolution distributed strain measurements using standard optical fiber. These measurements are shown to correlate well with other standard measurement methods and theoretical models of simple structures.
Keywords :
fibre optic sensors; reflectometry; strain measurement; OFDR technology; high-resolution distributed strain measurements; high-resolution distributed strain sensing; optical frequency domain reflectometry based sensing; standard optical fiber; Optical fiber sensors; Optical fibers; Optical reflection; Optical scattering; Strain; Strain measurement;
Conference_Titel :
Avionics, Fiber- Optics and Photonics Technology Conference (AVFOP), 2011 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-7344-1
DOI :
10.1109/AVFOP.2011.6082120
