• DocumentCode
    2353823
  • Title

    Optical frequency domain reflectometry for high-resolution distributed strain sensing

  • Author

    Bos, Joseph J. ; Gifford, Dawn K. ; Sang, Alex K. ; Froggatt, Mark E.

  • Author_Institution
    A Div. of Luna Innovations Inc., Luna Technol., Blacksburg, VA, USA
  • fYear
    2011
  • fDate
    4-6 Oct. 2011
  • Firstpage
    47
  • Lastpage
    48
  • Abstract
    Commercially available OFDR technology provides high-resolution distributed strain measurements using standard optical fiber. These measurements are shown to correlate well with other standard measurement methods and theoretical models of simple structures.
  • Keywords
    fibre optic sensors; reflectometry; strain measurement; OFDR technology; high-resolution distributed strain measurements; high-resolution distributed strain sensing; optical frequency domain reflectometry based sensing; standard optical fiber; Optical fiber sensors; Optical fibers; Optical reflection; Optical scattering; Strain; Strain measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Avionics, Fiber- Optics and Photonics Technology Conference (AVFOP), 2011 IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-7344-1
  • Type

    conf

  • DOI
    10.1109/AVFOP.2011.6082120
  • Filename
    6082120
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2353823