• DocumentCode
    2353833
  • Title

    A high-performance poly-Si TFT technology compatible with flexible plastic substrates

  • Author

    Tung, Y.-J. ; Carey, P.M. ; Smith, P.M. ; Theiss, S.D. ; Meng, X. ; Weiss, R. ; Davis, G.A. ; Aebi, V. ; King, T.-J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1998
  • fDate
    22-24 June 1998
  • Firstpage
    102
  • Lastpage
    103
  • Abstract
    The development of a high-performance polycrystalline silicon (poly-Si) thin film transistor (TFT) technology which is compatible with plastic substrates is critical to the realisation of active matrix flat-panel displays that are flexible, lightweight, low cost and rugged. In this paper, we present performance comparisons of self-aligned aluminium top-gate poly-Si TFTs fabricated using a maximum substrate temperature of 150/spl deg/C using excimer laser annealing. The best devices have effective carrier mobilities >90 cm/Vs, threshold voltage <10 V and breakdown voltage >35 V. These are the highest performance poly-Si TFTs reported to date for use with polyester substrates.
  • Keywords
    carrier mobility; elemental semiconductors; flat panel displays; laser beam annealing; liquid crystal displays; plastic packaging; silicon; thin film transistors; 10 V; 150 C; 35 V; Al-Si; active matrix flat-panel displays; breakdown voltage; carrier mobility; display cost; display flexibility; excimer laser annealing; flexible plastic substrates; plastic substrate compatibility; poly-Si TFT technology; poly-Si TFTs; polycrystalline silicon thin film transistor technology; polyester substrates; self-aligned aluminium top-gate poly-Si TFTs; substrate temperature; threshold voltage; Active matrix technology; Aluminum; Annealing; Costs; Displays; Plastics; Silicon; Substrates; Temperature; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1998. 56th Annual
  • Conference_Location
    Charlottesville, VA, USA
  • Print_ISBN
    0-7803-4995-4
  • Type

    conf

  • DOI
    10.1109/DRC.1998.731139
  • Filename
    731139