• DocumentCode
    2353842
  • Title

    Study of stress grading systems working under fast rise time pulses

  • Author

    Espino-Cortes, F.P. ; Montasser, Y. ; Jayaram, S.H. ; Cherney, E.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
  • fYear
    2006
  • fDate
    11-14 June 2006
  • Firstpage
    380
  • Lastpage
    383
  • Abstract
    Stress grading coatings of cable and coil terminations are considerably affected by the high dV/dt present in PWM voltage source converters. As repetitive steep transients can result in the development of hot spots and enhanced electric fields in the stress grading (SG) system, premature failures of power apparatus can occur. Stress grading systems need to be improved to work under such conditions and to obtain the desired stress relief. In this work, a stress grading system that can help to control the electric stress as well as the hot spots under fast rise time pulses is studied. It is important to design and test these systems considering the real PWM waveform in which both the fast pulses and the fundamental low frequency are included. With that purpose a fast single-phase low power two-level PWM generator was used to evaluate the stress grading system. Also this generator was used to measure some of the dielectric properties of the material
  • Keywords
    PWM power convertors; cables (electric); coatings; coils; dielectric measurement; electric fields; transients; PWM generator; PWM voltage source converter; cable coatings; coil termination; dielectric properties measurement; electric fields; hot spot; power apparatus failure; steep transient; stress grading system; Coatings; Coils; Control systems; Frequency; Pulse width modulation; Pulse width modulation converters; Space vector pulse width modulation; Stress control; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Print_ISBN
    1-4244-0333-2
  • Type

    conf

  • DOI
    10.1109/ELINSL.2006.1665337
  • Filename
    1665337