DocumentCode
2353847
Title
Fine pitch wire bonding development using statistical design of experiment
Author
Shu, William K.
Author_Institution
VLSI Technol. Inc., San Jose, CA, USA
fYear
1995
fDate
21-24 May 1995
Firstpage
91
Lastpage
101
Abstract
Response Surface Methodology was used to characterize a wire bond system for fine pad pitch application. Ball shear stress, defined as ball shear force per unit area, was proposed as a better parameter over ball shear force for wire bond optimization. 3D chart arrays were presented for overall visualization of the characteristics of the response surfaces. Contour chart arrays were used for quantifying each response in terms of bond parameters. To optimize for the “ideal” fine pitch wire bond, it is recommended to use contour charts to locate bonding windows that can produce the best ball shear stress, or the best possible ball shear stress when under additional dimensional, material, or process constraints
Keywords
design of experiments; fine-pitch technology; lead bonding; ball shear stress; contour chart arrays; fine pitch wire bonding; optimization; response surface methodology; statistical design of experiment; Assembly; Bonding forces; Circuits; Costs; Gold; Response surface methodology; Size measurement; Stress; Temperature; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.514367
Filename
514367
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