DocumentCode :
2353847
Title :
Fine pitch wire bonding development using statistical design of experiment
Author :
Shu, William K.
Author_Institution :
VLSI Technol. Inc., San Jose, CA, USA
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
91
Lastpage :
101
Abstract :
Response Surface Methodology was used to characterize a wire bond system for fine pad pitch application. Ball shear stress, defined as ball shear force per unit area, was proposed as a better parameter over ball shear force for wire bond optimization. 3D chart arrays were presented for overall visualization of the characteristics of the response surfaces. Contour chart arrays were used for quantifying each response in terms of bond parameters. To optimize for the “ideal” fine pitch wire bond, it is recommended to use contour charts to locate bonding windows that can produce the best ball shear stress, or the best possible ball shear stress when under additional dimensional, material, or process constraints
Keywords :
design of experiments; fine-pitch technology; lead bonding; ball shear stress; contour chart arrays; fine pitch wire bonding; optimization; response surface methodology; statistical design of experiment; Assembly; Bonding forces; Circuits; Costs; Gold; Response surface methodology; Size measurement; Stress; Temperature; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.514367
Filename :
514367
Link To Document :
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