• DocumentCode
    2353847
  • Title

    Fine pitch wire bonding development using statistical design of experiment

  • Author

    Shu, William K.

  • Author_Institution
    VLSI Technol. Inc., San Jose, CA, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    91
  • Lastpage
    101
  • Abstract
    Response Surface Methodology was used to characterize a wire bond system for fine pad pitch application. Ball shear stress, defined as ball shear force per unit area, was proposed as a better parameter over ball shear force for wire bond optimization. 3D chart arrays were presented for overall visualization of the characteristics of the response surfaces. Contour chart arrays were used for quantifying each response in terms of bond parameters. To optimize for the “ideal” fine pitch wire bond, it is recommended to use contour charts to locate bonding windows that can produce the best ball shear stress, or the best possible ball shear stress when under additional dimensional, material, or process constraints
  • Keywords
    design of experiments; fine-pitch technology; lead bonding; ball shear stress; contour chart arrays; fine pitch wire bonding; optimization; response surface methodology; statistical design of experiment; Assembly; Bonding forces; Circuits; Costs; Gold; Response surface methodology; Size measurement; Stress; Temperature; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.514367
  • Filename
    514367