Title :
A breakdown voltage simulator for semiconductor devices TonaddeIIb
Author :
Omura, I. ; Nakagawa, A.
Author_Institution :
Toshiba Corp.
Keywords :
Avalanche breakdown; Breakdown voltage; Charge carrier processes; Electrodes; P-n junctions; Poisson equations; Semiconductor devices; Silicon;
Conference_Titel :
Power Semiconductor Devices and ICs, 1990. ISPSD '90. Proceedings of the 2nd International Symposium on
DOI :
10.1109/ISPSD.1990.991053
