Title :
Partial discharge erosion of nano-filled enameled wires subjected to high frequency waveforms
Author :
Haq, Saeed Ul ; Jayaram, Shesha H. ; Cherney, Edward A. ; Simon, L.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
Abstract :
The accelerated degradation under high frequency AC voltages of enameled wires that are nano-filled is compared to enameled wires without nano-fillers. The surface roughness and erosion depth of wire specimens, aged in the presence of partial discharge (PD), are studied using a scanning electron microscope (SEM). Changes in the chemical bonding behavior of wire insulation due to PD erosion, are also assessed by Fourier transform infrared spectroscopy (FTIR). A comparative evaluation of the residual life of the wires, aged under high frequency AC waveforms reveals that the newly developed nano-filled enameled wires, especially those with fumed silica, attain a life that is twice that of conventional wires, which is a significant improvement
Keywords :
Fourier transform spectroscopy; ageing; enamels; infrared spectroscopy; insulated wires; machine insulation; machine windings; nanotechnology; partial discharges; surface roughness; Fourier transform infrared spectroscopy; ageing; chemical bonding; enameled wire; frequency waveform; fumed silica; insulation degradation; nanofiller; partial discharge erosion; scanning electron microscope; surface roughness; Acceleration; Aging; Degradation; Frequency; Partial discharges; Rough surfaces; Scanning electron microscopy; Surface roughness; Voltage; Wires;
Conference_Titel :
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
Print_ISBN :
1-4244-0333-2
DOI :
10.1109/ELINSL.2006.1665341
