DocumentCode :
235398
Title :
Very thin POP and SIP packaging approaches to achieve functionality integration prior to TSV implementation
Author :
Roa, Fernando
Author_Institution :
Amkor Technol., Inc., Chandler, AZ, USA
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1656
Lastpage :
1660
Abstract :
Discrete function integration is achieved at the package level with a variety of packaging solutions, mainly package on package. In this paper we review mainstream package on package technology offerings and compare them against improved versions of these packages where advances in materials properties and processing techniques are leveraged to meet increasingly tighter overall package thickness requirements while maintaining or improving the reliability, yield and cost effectiveness metrics set by the existing technologies. Different avenues to achieve very thin POP and system-in-a-package constructions are explored in detail, showing the implications in terms of material properties, new or improved processing steps and design trade-offs. Similarly, we show examples where these new techniques have been used successfully to achieve the stricter thickness targets and to prove that these technologies are ready to be applied and leveraged immediately for functionality integration without requiring extended development times or completely new processing methodologies.
Keywords :
integrated circuit reliability; system-in-package; three-dimensional integrated circuits; SIP packaging; TSV implementation; discrete function integration; functionality integration; materials properties; package on package; system-in-a-package constructions; very thin POP packaging; Assembly; Packaging; Stacking; Substrates; Three-dimensional displays; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897518
Filename :
6897518
Link To Document :
بازگشت