Title :
Electrically Stable, Solution-Processed Amorphous Oxide IZO Thin-Film Transistors Through a UV-Ozone Assisted Sol-Gel Approach
Author :
Singh, Thokchom Birendra ; Jasieniak, J.J. ; de Oliveira Tozi, Leonardo ; Easton, Christopher David ; Bown, Mathew
Author_Institution :
Mater. Sci. & Eng., CSIRO, Clayton, VIC, Australia
Abstract :
Metal acetylacetonates are conventional sol-gel precursors used to deposit thin amorphous metal oxide films of In-Zn-O (IZO) suitable for thin-film field effect transistors (TFTs). In this paper, we couple this traditional approach with a postdeposition UV-ozone treatment to effectively reduce carbon impurities prior to any thermal treatment steps. Therefore, we find that the rate of bulk metal oxide formation is enhanced, thus enabling a significant reduction of the processing temperature necessary to achieve high-mobility transistors. Optimized TFT structures processed at 300 °C show n-type mobility of 35 cm2/Vs with on and off ratio of 107. Moreover, positive bias stress tests of such devices are found to exhibit one the lowest threshold voltage shifts of any solution-processed amorphous TFT fabricated without a passivation layer.
Keywords :
indium compounds; ozonation (materials processing); sol-gel processing; thin film transistors; InZnO; UV-ozone assisted sol-gel process; bulk metal oxide formation; carbon impurity reduction; electrically stable amorphous oxide; high mobility transistor; metal acetylacetonates; postdeposition UV-ozone treatment; solution processed amorphous oxide; temperature 300 C; thermal treatment; thin film field effect transistors; Annealing; Impurities; Logic gates; Metals; Substrates; Thin film transistors; Active matrix organic light emitting-diodes (AMOLEDs); amorphous oxide semiconductors; charge carriers mobility; high uniformity;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2014.2303796