Title :
A highly testable 1-out-of-3 CMOS checker
Author :
Metra, Cecilia ; Favalli, Michele ; Olivo, Piero ; Riccò, Bruno
Author_Institution :
DEIS, Bologna Univ., Italy
Abstract :
The problem of the design of a highly testable 1-out-of-3 CMOS checker has been considered. First some recently presented CMOS checkers have been analyzed, then a novel checker has been proposed to be certainly preferable from the self-testing capability and overall performance point of view
Keywords :
CMOS logic circuits; 1-out-of-3 CMOS checker; bridging faults; performance; self-testing; Built-in self-test; Circuit faults; Circuit testing; Cost function; Humans; Logic testing; Medical tests; Performance analysis; Performance evaluation; System testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location :
Venice
Print_ISBN :
0-8186-3502-9
DOI :
10.1109/DFTVS.1993.595823
