• DocumentCode
    2354061
  • Title

    A highly testable 1-out-of-3 CMOS checker

  • Author

    Metra, Cecilia ; Favalli, Michele ; Olivo, Piero ; Riccò, Bruno

  • Author_Institution
    DEIS, Bologna Univ., Italy
  • fYear
    1993
  • fDate
    27-29 Oct 1993
  • Firstpage
    279
  • Lastpage
    286
  • Abstract
    The problem of the design of a highly testable 1-out-of-3 CMOS checker has been considered. First some recently presented CMOS checkers have been analyzed, then a novel checker has been proposed to be certainly preferable from the self-testing capability and overall performance point of view
  • Keywords
    CMOS logic circuits; 1-out-of-3 CMOS checker; bridging faults; performance; self-testing; Built-in self-test; Circuit faults; Circuit testing; Cost function; Humans; Logic testing; Medical tests; Performance analysis; Performance evaluation; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
  • Conference_Location
    Venice
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-3502-9
  • Type

    conf

  • DOI
    10.1109/DFTVS.1993.595823
  • Filename
    595823
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2354061