Title :
Liquid crystal imaging for temperature measurement of electronic devices
Author :
Azar, Kaveh ; Benson, John R. ; Manno, Vincent P.
Author_Institution :
AT&T Bell Labs., Ward Hill, MA, USA
Abstract :
The liquid crystal imaging (LCI) technique has been shown to be a viable method for part level temperature measurement. The steps necessary to develop this capability and its sensitivity to various parameters are discussed and highlighted. Comparison of LCI and point measurement showed that high accuracy can be achieved with this method. The spatial resolution which plays a critical role in this measurement was shown to be attainable for part level measurements. Even higher spatial resolution can be attained with modifications to the optics and image processing software. Calibration procedures are also described
Keywords :
calibration; electron device testing; electronic equipment testing; infrared imaging; liquid crystal devices; temperature measurement; thin film resistors; calibration; electronic devices; image processing software; liquid crystal imaging; part level measurements; sensitivity; spatial resolution; temperature measurement; thin film resistor; Calibration; Diodes; Infrared imaging; Liquid crystal devices; Liquid crystals; Semiconductor device measurement; Spatial resolution; Temperature distribution; Temperature measurement; Temperature sensors;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1991. SEMI-THERM VII. Proceedings., Seventh Annual IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
0-87942-664-0
DOI :
10.1109/STHERM.1991.152907
