DocumentCode
2354144
Title
A novel field plate structure under high voltage interconnections
Author
Fujishima, Naoto ; Takeda, Hisao
Author_Institution
Fuji Electric Corp.
fYear
1990
fDate
1990
Firstpage
91
Lastpage
96
Keywords
Breakdown voltage; Conductivity; Displays; Electrodes; Epitaxial layers; Fabrication; Isolation technology; Oxidation; Power supplies; Telecommunications;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 1990. ISPSD '90. Proceedings of the 2nd International Symposium on
ISSN
1063-6854
Type
conf
DOI
10.1109/ISPSD.1990.991066
Filename
991066
Link To Document