DocumentCode :
235437
Title :
Effects of various environmental conditions on the electrical properties and interfacial reliability of printed Ag / polyimide system
Author :
Byung-Hyun Bae ; Min-Su Jeong ; Byeong Rok Lee ; Joung-Hoon Choo ; Eun-Kuk Choi ; Jong-Sun Yoon ; Young-Bae Park
Author_Institution :
Sch. of Mater. Sci. & Eng., Andong Nat. Univ., Andong, South Korea
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1735
Lastpage :
1739
Abstract :
Effects of 200 °C annealing and 85 °C/85% relative humidity (R.H.) temperature/humidity environments on the electrical resistivity and interfacial adhesion energy between screen-printed Ag film and polyimide substrate were systematically investigated. Measured peel strength was 22.2 gf/mm before environmental treatment, and then decreased to 0.1 and 0.5 gf/mm for annealing and temperature/humidity treatment during 500 hours, respectively. Cu oxide formation at Cu/Ag interface and the degradation of polyimide itself seem to be responsible for adhesion decrease during annealing and temperature/humidity treatments, respectively. Screen printed Ag film shows the initial sharp decrease in resistivity during annealing due to effective binder removal effect and partially sintering effect.
Keywords :
adhesion; annealing; electrical resistivity; humidity; polymers; reliability; silver; sintering; thick films; Cu oxide formation; Cu-Ag interface; annealing; binder removal effect; electrical properties; electrical resistivity; environmental conditions; environmental treatment; interfacial adhesion energy; interfacial reliability; partially sintering effect; peel strength; polyimide substrate; printed Ag-polyimide system; relative humidity; screen-printed Ag film; temperature 200 degC; temperature-humidity environments; time 500 hour; Adhesives; Annealing; Films; Humidity; Metals; Polyimides; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897531
Filename :
6897531
Link To Document :
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