Title :
A framework for early stage quality-fault tolerance analysis of embedded control systems
Author :
Vadlamudi, S.G. ; Chakrabarti, P.P. ; Das, Dipankar ; Sinha, Purnendu
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India
Abstract :
This work presents a static-analysis based method for analyzing the robustness of a given embedded control system design, in the presence of quality-faults in sensors, software components, and inter-connections. The method characterizes the individual components of the system by storing the relations between the precision of inputs and the precision of outputs in what we call, lookup tables (LUTs). A network of LUTs thus formed which represent the given control system is converted into a satisfiability modulo theory (SMT) instance, such that a satisfying assignment corresponds to a potential counterexample (the set of quality-faults which violate the given fault-tolerance requirements) or hot-spot in the design. Hot-spots obtained in this manner are counter-verified through simulation to filter the false-positives. Experimental results on the fault-tolerant fuel controller from Simulink automotive library demonstrate the efficacy of the proposed approach.
Keywords :
computability; control system synthesis; embedded systems; fault tolerant computing; interconnections; robust control; safety-critical software; table lookup; embedded control system design; fault-tolerant fuel controller; hot-spot; inter-connections; lookup tables; quality-fault tolerance analysis; satisfiability modulo theory; sensors; simulink automotive library; software components; static-analysis; Degradation; Fault tolerance; Fault tolerant systems; Noise; Sensors; Table lookup; Trajectory; embedded systems; fault injection; fault tolerant systems; quality faults; robustness;
Conference_Titel :
Dependable Systems & Networks (DSN), 2011 IEEE/IFIP 41st International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9232-9
Electronic_ISBN :
1530-0889
DOI :
10.1109/DSN.2011.5958245