DocumentCode :
2354382
Title :
Modeling of stress-enhancement at defects inside cable insulation
Author :
Person, T.J. ; Yang, K. ; Jiang, J.
Author_Institution :
Dow Chem. Co., Somerset, NJ
fYear :
2006
fDate :
11-14 June 2006
Firstpage :
506
Lastpage :
508
Abstract :
AC breakdowns are commonly used as a performance indicator for power cables, and yet the data generated can be misinterpreted if the test section of cable is found to have a manufacturing defect. As an example, in a recent publication, dielectric a breakdown value on a 17-year field aged cable was treated as a "suspension" by the authors after the discovery of a conductor shield skip at the failure location; and yet, others have taken the same data set and have analyzed the uncensored data as indicative of the material performance. In an effort to resolve the differences, the same data set is considered here, with an assumption that degree of aging is not significantly impacted by any enhancement of field-aging stresses. Statistical analysis is performed to determine if the questionable breakdown value can be considered an outlier. A 2-dimensional finite element analysis based upon the shape of the defect enables an estimate of the local stress enhancement factor, and a "corrected" breakdown value is calculated. The original authors conservative treatment of the questionable breakdown value as a "suspension" is supported by analysis with inclusion of a stress-corrected breakdown value, and the two approaches yield similar failure distributions. Use of the uncorrected value in discussions related to failure probabilities on the low-stress side of the distribution is shown to substantially underestimate failure stresses
Keywords :
ageing; cable shielding; conductors (electric); electric breakdown; failure analysis; finite element analysis; insulation testing; power cable insulation; power cable testing; statistical analysis; 2-dimensional finite element analysis; AC breakdown; conductor shield; failure location; field-aging stress; power cable insulation defect; statistical analysis; Aging; Cable insulation; Cable shielding; Communication cables; Conducting materials; Electric breakdown; Failure analysis; Power cable insulation; Power cables; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
ISSN :
1089-084X
Print_ISBN :
1-4244-0333-2
Type :
conf
DOI :
10.1109/ELINSL.2006.1665367
Filename :
1665367
Link To Document :
بازگشت