DocumentCode :
2354402
Title :
Predicted failure criterion (von-Mises stress) for moisture-sensitive plastic packages
Author :
Suhir, Ephraim
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
266
Lastpage :
284
Abstract :
Constitutive equations, based on von-Karman´s equations for large deflections of plates with consideration of thermal effects, are developed for the assessment of the propensity of moisture-sensitive plastic packages to structural failures during surface-mounting them onto printed circuit boards. The maximum value of the von-Mises stress in the molding compound is suggested to be used as a suitable failure criterion which is able to reflect the cumulative role of various geometrical and materials factors affecting the strength of the package. A situation when the molding compound is completely delaminated from the chip (or the paddle) is examined in detail. The calculated stresses are in good agreement with experimental observations. The developed calculation procedure for the prediction of the von-Mises stress can be used for the preliminary separation of the packages that need to be “baked” and “bagged” from these that supposedly do not
Keywords :
environmental degradation; failure analysis; moisture; plastic packaging; surface mount technology; bagging; baking; chip; constitutive equations; delamination; failure criterion; moisture sensitivity; molding compound; paddle; plastic packages; plate deflection; printed circuit boards; surface mounting; thermal effects; von-Karman equations; von-Mises stress; Delamination; Equations; Manufacturing; Moisture; Plastic packaging; Printed circuits; Reflow soldering; Surface cracks; Temperature; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.514396
Filename :
514396
Link To Document :
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