• DocumentCode
    2354411
  • Title

    Cost analysis: solder bumped flip chip versus wire bonding

  • Author

    Lau, John ; Chen, Ray

  • Author_Institution
    Express Packaging Syst. Inc., Palo Alto, CA, USA
  • fYear
    1998
  • fDate
    19-21 Oct 1998
  • Firstpage
    464
  • Lastpage
    472
  • Abstract
    The cost of wire bonding chip and solder bumped flip chip on board or on organic substrate is studied. The effects of IC chip yields, gold and solder materials, and the major equipment of these technologies on costs are examined. Useful equations and charts for determining the cost of and comparing the cost between these technologies are provided
  • Keywords
    chip-on-board packaging; costing; flip-chip devices; integrated circuit bonding; integrated circuit packaging; integrated circuit yield; lead bonding; microassembling; soldering; Au; IC chip yields; chip wire bonding; cost analysis; cost comparison; cost determination; equipment costs; gold wires; organic substrate; solder bumped flip chip; solder bumped flip chip on board; solder materials; wire bonding; Bonding; Costs; Electronic equipment testing; Encapsulation; Equations; Flip chip; Gold; Integrated circuit interconnections; Packaging; Substrates; System testing; Wafer bonding; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-4523-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1998.731173
  • Filename
    731173