• DocumentCode
    2354465
  • Title

    Experiments and 2D-simulations for quasi-saturation effect in ponver VDMOS transistors

  • Author

    Park, Chan-Kwang ; Lee, Kwyro

  • Author_Institution
    Korea Advanced Institute of Science and Technology
  • fYear
    1990
  • fDate
    1990
  • Firstpage
    219
  • Lastpage
    224
  • Keywords
    Boron; Critical current; Degradation; Electron mobility; Epitaxial layers; Fabrication; Testing; Transconductance; Transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1990. ISPSD '90. Proceedings of the 2nd International Symposium on
  • ISSN
    1063-6854
  • Type

    conf

  • DOI
    10.1109/ISPSD.1990.991086
  • Filename
    991086