Title :
Tne study of deterioration wchanigm and stability tecnnique of surface sustained voltage of flower electronic devices
Author :
Xu Chuanxiang ; Shaoyun, Zhang ; Yuzhu, Feng ; Di, Liu
Author_Institution :
Xi´´an Jiaotong University
Keywords :
Diodes; Impurities; Lacquers; Protection; Semiconductor films; Silicon; Stability; Surface charging; Temperature; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1990. ISPSD '90. Proceedings of the 2nd International Symposium on
DOI :
10.1109/ISPSD.1990.991087
