• DocumentCode
    2354497
  • Title

    Application of a proton irridation technique to high voltage thyristors

  • Author

    Shimizu, Y. ; Yokota, T. ; Kohno, I.

  • Author_Institution
    Hitachi, Ltd.
  • fYear
    1990
  • fDate
    1990
  • Firstpage
    231
  • Lastpage
    235
  • Keywords
    Annealing; Anodes; Cathodes; Charge carrier lifetime; Impurities; Protons; Silicon; Surface resistance; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1990. ISPSD '90. Proceedings of the 2nd International Symposium on
  • ISSN
    1063-6854
  • Type

    conf

  • DOI
    10.1109/ISPSD.1990.991088
  • Filename
    991088