Title :
Design optimization for improving high power GTO switching characteristics with ´alloy free technology´
Author :
Matsuda, H. ; Fujiwara, T. ; Nishitani, K.
Author_Institution :
TOSHIBA
Keywords :
Anodes; Cathodes; Design optimization; Impurities; Lead; Power semiconductor switches; Switching loss; Tail; Voltage; Wafer bonding;
Conference_Titel :
Power Semiconductor Devices and ICs, 1990. ISPSD '90. Proceedings of the 2nd International Symposium on
DOI :
10.1109/ISPSD.1990.991090
