Title :
Design space exploration of high-speed busses using statistical methods
Author :
Matoglu, E. ; Swaminathan, M. ; Cases, M. ; Pham, N. ; Araujo, D.N.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents an efficient statistical method to increase the data rate of local I/O bus. Parametric yield of the PCI-X has been computed at a higher data rate. Then yield loss at higher data rate has been recovered by making the most feasible and effective adjustments. Instead of full factorial signal integrity analysis, sensitivity relations and statistical distributions of signal integrity measures have been computed, which supply detailed information to designers and manufacturers.
Keywords :
normal distribution; peripheral interfaces; regression analysis; sensitivity analysis; PCI-X; data rate; design space exploration; efficient statistical method; high-speed bus; local I/O bus; parametric yield; piecewise linear regression; sensitivity relations; signal integrity measures; Analytical models; Bandwidth; Clocks; Information analysis; Manufacturing; Signal analysis; Space exploration; Space technology; Statistical analysis; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2003
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-8128-9
DOI :
10.1109/EPEP.2003.1249991
