Design space exploration of high-speed busses using statistical methods

Author

Matoglu, E. ; Swaminathan, M. ; Cases, M. ; Pham, N. ; Araujo, D.N.

Author_Institution

Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2003

fDate

27-29 Oct. 2003

Firstpage

19

Lastpage

22

Abstract

This paper presents an efficient statistical method to increase the data rate of local I/O bus. Parametric yield of the PCI-X has been computed at a higher data rate. Then yield loss at higher data rate has been recovered by making the most feasible and effective adjustments. Instead of full factorial signal integrity analysis, sensitivity relations and statistical distributions of signal integrity measures have been computed, which supply detailed information to designers and manufacturers.

Keywords

normal distribution; peripheral interfaces; regression analysis; sensitivity analysis; PCI-X; data rate; design space exploration; efficient statistical method; high-speed bus; local I/O bus; parametric yield; piecewise linear regression; sensitivity relations; signal integrity measures; Analytical models; Bandwidth; Clocks; Information analysis; Manufacturing; Signal analysis; Space exploration; Space technology; Statistical analysis; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 2003

Conference_Location

Princeton, NJ, USA

Print_ISBN

0-7803-8128-9

Type

conf

DOI

10.1109/EPEP.2003.1249991

Filename

1249991