Title :
CPU power supply impedance profile measurement using FFT and clock gating
Author_Institution :
MTM Sci. Center, Intel Corp., Haifa, Israel
Abstract :
CPU bypass mode clock gating and oscilloscope FFT features enable accurate measurement of a CPU´s power delivery network impedance profile. The method described is self checking. Impedance profile characterization up to 100MHz is demonstrated.
Keywords :
clocks; computer power supplies; digital phase locked loops; electric impedance measurement; fast Fourier transforms; power integrated circuits; power supply circuits; CPU power supply; accurate measurement; bypass mode clock gating; clock generation; distributed current consumption; impedance profile measurement; oscilloscope FFT features; power delivery network; self checking; Clocks; Current measurement; Frequency; Impedance measurement; Packaging; Phase locked loops; Power measurement; Power supplies; Semiconductor device measurement; Silicon;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2003
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-8128-9
DOI :
10.1109/EPEP.2003.1249993
