Title :
Novel conductive paste using Hybrid Silver Sintering Technology for high reliability power semiconductor packaging
Author :
Jin, Hye-Jin ; Kanagavel, Senthil ; Wai Foo Chin
Author_Institution :
Alpha Adv. Mater., Alent PLC Co., Suwanee, GA, USA
Abstract :
A number of industries are developing new product-lines with innovative electronics packages that require low thermal resistance and high temperature stability, including hybrid electric vehicles, concentrator photovoltaic and wide bandgap RF amplifiers. One of the largest obstacles in the design and manufacture is the thermal management of the devices. Localized heat generation is the characteristic of the semiconductor chips used in these devices. For high power applications the thermal impedance of the die attach layer can play significant role in the thermal management and the operating temperature. Therefore, one would like to use the highest thermal conductivity and lowest thermal resistance die attach material that is capable for high volume manufacturing. In a typical electronic packaging process, chips are attached to substrates and electrically connected before they are encapsulated or sealed for protection. The attachment and electrical interconnections provide the chip with an infrastructure for the flow of electrical signals, mechanical support and heat removal. The die attach materials(1) used in the packaging of high performance power semiconductors are required to have high thermal conductivity. Lead solders, eutectic gold-tin, transient liquid phase sintering (TLPS) pastes(2) and nano-silver sintering technology(3) are typical materials used for the die attachment of power semiconductor. This paper will introduce a new die attach material using Hybrid Silver Sintering Technology (HSST).
Keywords :
conductive adhesives; encapsulation; microassembling; power semiconductor devices; semiconductor device packaging; semiconductor device reliability; silver; sintering; thermal conductivity; thermal management (packaging); thermal resistance; HSST; TLPS; conductive paste; device thermal management; die attach layer; electrical interconnection; encapsulation; eutectic gold-tin; high reliability power semiconductor packaging; high temperature stability; hybrid silver sintering technology; innovative electronic package; lead solder; localized heat generation; nanosilver sintering technology; power semiconductor die attachment; semiconductor chip; substrate; thermal conductivity; thermal impedance; thermal resistance; transient liquid phase sintering paste; Conductivity; Microassembly; Silicon; Silver; Temperature measurement; Thermal conductivity; Viscosity;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
DOI :
10.1109/ECTC.2014.6897541