Title :
Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems
Author :
Mandrekar, Rohan ; Swaminathan, Madhavan ; Chun, Sungjun
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.
Keywords :
circuit simulation; computer power supplies; high-speed integrated circuits; integrated circuit modelling; integrated circuit noise; power integrated circuits; power supply circuits; band-limited model; core power distribution network; current signatures extraction; current source; high performance computer systems; high speed digital systems; measurement based approach; signal model; simultaneous switching noise; Circuit noise; Circuit simulation; Digital systems; Fluctuations; Frequency; Integrated circuit noise; Noise generators; Phase noise; Semiconductor device noise; Switching circuits;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2003
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-8128-9
DOI :
10.1109/EPEP.2003.1249996
