• DocumentCode
    2355094
  • Title

    Using metrics to identify design patterns in object-oriented software

  • Author

    Antoniol, G. ; Fiutem, R. ; Cristoforetti, L.

  • Author_Institution
    ITC-IRST, Ist. per la Ricerca Sci. e Tecnologica, Trento, Italy
  • fYear
    1998
  • fDate
    20-21 Nov 1998
  • Firstpage
    23
  • Lastpage
    34
  • Abstract
    Object-oriented design patterns are an emergent technology: they are reusable micro-architectures, high level building blocks. This paper presents a conservative approach, based on a multi-stage reduction strategy using OO software metrics and structural properties to extract structural design patterns from OO design or code. Code and design are mapped into an intermediate representation, called Abstract Object Language, to maintain independence from the programming language and the adopted CASE tools. To assess the effectiveness of the pattern recovery process a portable environment written in Java, remotely accessible by means of any Web browser, has been developed. Based on this environment, experimental results obtained on public domain and industrial software are discussed in the paper
  • Keywords
    Java; object-oriented programming; public domain software; reverse engineering; software metrics; software reusability; Abstract Object Language; CASE tools; Java; Web browser; design patterns; high level building blocks; industrial software; multi-stage reduction strategy; object-oriented software; portable environment; programming language; public domain software; reusable micro-architectures; software metrics; structural design patterns; Books; Computer aided software engineering; Computer industry; Computer languages; Data mining; Java; Paper technology; Reverse engineering; Software metrics; Software systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Metrics Symposium, 1998. Metrics 1998. Proceedings. Fifth International
  • Conference_Location
    Bethesda, MD
  • Print_ISBN
    0-8186-9201-4
  • Type

    conf

  • DOI
    10.1109/METRIC.1998.731224
  • Filename
    731224