DocumentCode
2355163
Title
A heterogeneous CMOS-CNT architecture utilizing novel coding of boolean functions
Author
Singh, Ashish ; Zeineddine, Hady Ali ; Aziz, Adnan ; Vishwanath, Sriram ; Orshansky, Michael
Author_Institution
Univ. of Texas at Austin, Austin
fYear
2007
fDate
21-22 Oct. 2007
Firstpage
15
Lastpage
20
Abstract
We address the challenge of implementing reliable computation of Boolean functions in future nanocircuit fabrics. Such fabrics are projected to have very high defect rates. We overcome this limitation by using a combination of cheap but unreliable nanodevices and reliable but expensive CMOS devices. The contribution of this work is twofold - (1) A heterogeneous architecture suitable for low level defect tolerance (2) A novel coding strategy that for the first time exploited the structure of Boolean function for better coder. In our approach, defect tolerance is achieved through a novel coding of Boolean functions; specifically, we exploit the don´t cares of Boolean functions encountered in multi-level Boolean logic networks for constructing better codes. The optimal coding problem is NP-hard. We solved it with a SAT based heuristic. We show that compared to direct application of existing coding techniques, the coding overhead in terms of extra bits can be reduced, on average by 23%, and savings can go up to 34%. We demonstrate that by incorporating efficient coding techniques more than a 20% average yield improvement is possible in case of 10% defect rates. We incur a negligible delay penalty of less than 1% for decoder and the area is 13X smaller compared 22 nm CMOS technology and 32% smaller than TMR (triple modular redundancy) coding scheme.
Keywords
Boolean functions; CMOS logic circuits; carbon nanotubes; computability; computational complexity; encoding; nanoelectronics; nanotube devices; Boolean functions; NP-hard problem; decoder; expensive CMOS devices; heterogeneous CMOS-CNT architecture; low level defect tolerance; multilevel Boolean logic networks; nanocircuit fabrics; optimal coding problem; size 22 nm; triple modular redundancy coding scheme; unreliable nanodevices; Boolean functions; CMOS technology; Circuit faults; Computer architecture; Fabrics; Integrated circuit reliability; Integrated circuit technology; Nanoscale devices; Reconfigurable logic; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoscale Architectures, 2007. NANOSARCH 2007. IEEE International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-1791-9
Electronic_ISBN
978-1-4244-1791-9
Type
conf
DOI
10.1109/NANOARCH.2007.4400852
Filename
4400852
Link To Document