• DocumentCode
    2355168
  • Title

    Automation of seizure duration estimation during ECT; use of fractal dimension

  • Author

    Gangadhar, B.N. ; Dutt, D.N. ; Janakiramaiah, N. ; Sadasivan, P.K.

  • Author_Institution
    Dept. of Psychiatry, NIMHANS, Bangalore, India
  • fYear
    1995
  • fDate
    15-18 Feb 1995
  • Firstpage
    13575
  • Lastpage
    13940
  • Abstract
    Obtaining seizure of an adequate length is essential during electroconvulsive therapy (ECT). Here, the authors describe an automated procedure of estimating the seizure duration using running fractal dimension. Fractal dimension (FD) or EEG records from 20 patients (14 males, age range 15-45 yrs) receiving ECT was calculated. The lowest FD values occurred in the post-seizure phase. Running fractal dimension on epochs of 4 seconds length each with 75% overlap was also computed. A computer algorithm was developed to detect the EEG epoch with lowest FD and the seizure duration was estimated thereof. Seizure duration estimates from automated method (mean, SD=67.95, 31.7 secs) agreed significantly (intraclass correlation, `r´=0.9, p<0.01) with those of clinical rating of analog EEG records (mean, SD=69.15, 32.2 secs)
  • Keywords
    bioelectric phenomena; electroencephalography; fractals; medical signal processing; patient treatment; 15 to 45 yr; 31.7 s; 4 s; 67.95 s; EEG epoch; adequate length seizure; analog EEG records; automated procedure; clinical rating; computer algorithm; electroconvulsive therapy; intraclass correlation; post-seizure phase; running fractal dimension; seizure duration estimation automation; Automation; Electrical capacitance tomography; Electroencephalography; Fractals; Guidelines; Measurement standards; Medical treatment; Monitoring; Psychiatry; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1995 and 14th Conference of the Biomedical Engineering Society of India. An International Meeting, Proceedings of the First Regional Conference., IEEE
  • Conference_Location
    New Delhi
  • Print_ISBN
    0-7803-2711-X
  • Type

    conf

  • DOI
    10.1109/RCEMBS.1995.532965
  • Filename
    532965