DocumentCode :
2355168
Title :
Automation of seizure duration estimation during ECT; use of fractal dimension
Author :
Gangadhar, B.N. ; Dutt, D.N. ; Janakiramaiah, N. ; Sadasivan, P.K.
Author_Institution :
Dept. of Psychiatry, NIMHANS, Bangalore, India
fYear :
1995
fDate :
15-18 Feb 1995
Firstpage :
13575
Lastpage :
13940
Abstract :
Obtaining seizure of an adequate length is essential during electroconvulsive therapy (ECT). Here, the authors describe an automated procedure of estimating the seizure duration using running fractal dimension. Fractal dimension (FD) or EEG records from 20 patients (14 males, age range 15-45 yrs) receiving ECT was calculated. The lowest FD values occurred in the post-seizure phase. Running fractal dimension on epochs of 4 seconds length each with 75% overlap was also computed. A computer algorithm was developed to detect the EEG epoch with lowest FD and the seizure duration was estimated thereof. Seizure duration estimates from automated method (mean, SD=67.95, 31.7 secs) agreed significantly (intraclass correlation, `r´=0.9, p<0.01) with those of clinical rating of analog EEG records (mean, SD=69.15, 32.2 secs)
Keywords :
bioelectric phenomena; electroencephalography; fractals; medical signal processing; patient treatment; 15 to 45 yr; 31.7 s; 4 s; 67.95 s; EEG epoch; adequate length seizure; analog EEG records; automated procedure; clinical rating; computer algorithm; electroconvulsive therapy; intraclass correlation; post-seizure phase; running fractal dimension; seizure duration estimation automation; Automation; Electrical capacitance tomography; Electroencephalography; Fractals; Guidelines; Measurement standards; Medical treatment; Monitoring; Psychiatry; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1995 and 14th Conference of the Biomedical Engineering Society of India. An International Meeting, Proceedings of the First Regional Conference., IEEE
Conference_Location :
New Delhi
Print_ISBN :
0-7803-2711-X
Type :
conf
DOI :
10.1109/RCEMBS.1995.532965
Filename :
532965
Link To Document :
بازگشت