• DocumentCode
    2355171
  • Title

    What-if analyses of multi-layer PWB embedded in the digital still camera with parallel-distributed FDTD-based simulator "BLESS"

  • Author

    Araki, Kenji ; KUBOTA, Hidemasa ; Watanabe, Takayuki ; Asai, Hideki

  • Author_Institution
    Sony Corp., Japan
  • fYear
    2003
  • fDate
    27-29 Oct. 2003
  • Firstpage
    169
  • Lastpage
    172
  • Abstract
    This paper describes a full-wave EMI (electromagnetic interference) simulator BLESS (Board Layout Evaluation and Suggestion System) for the printed wiring board (PWB) design with the consideration of electromagnetic compatibility (EMC) and power/signal integrity. This simulator is based on the parallel-distributed finite-difference time-domain (FDTD) method, and works on a PC-cluster. The accuracy of analysis by BLESS is verified in comparison with s-parameter measurements. Using the simulator, the full-wave analysis of the multi-layer PWB in a commercial digital still camera is demonstrated. With the aid of what-if analysis results, PWB design can be verified and optimized with less number of trial productions.
  • Keywords
    CCD image sensors; SPICE; circuit simulation; crosstalk; electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; multichip modules; printed circuit layout; transient analysis; BLESS; MCM; board layout evaluation and suggestion system; circuit simulator; crosstalk noise; digital still camera; electromagnetic compatibility; full-wave EMI simulator; multilayer PWB; parallel-distributed FDTD-based simulator; printed wiring board design; transient analyses; what-if analyses; Analytical models; Digital cameras; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Finite difference methods; Scattering parameters; Signal design; Time domain analysis; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2003
  • Conference_Location
    Princeton, NJ, USA
  • Print_ISBN
    0-7803-8128-9
  • Type

    conf

  • DOI
    10.1109/EPEP.2003.1250024
  • Filename
    1250024