• DocumentCode
    2355217
  • Title

    Reliable 808-nm high power laser diodes

  • Author

    Pawlik, Susanne ; Müller, Jürgen ; Lichtenstein, Norbert ; Jaeggi, Dominik ; Schmidt, Berthold

  • Author_Institution
    Bookham AG, Zurich, Switzerland
  • fYear
    2004
  • fDate
    25-25 Sept. 2004
  • Firstpage
    79
  • Lastpage
    80
  • Abstract
    A reliable 808-nm single mode laser diodes with a low divergent beam and high light output power is demonstrated. The device is found to be applicable for longitudinal pumping of Nd-doped solid state lasers.
  • Keywords
    laser beams; laser reliability; laser transitions; life testing; semiconductor device testing; semiconductor lasers; 808 nm; high power laser diodes; longitudinal pumping; low divergent beam; reliability; Diode lasers; Heat sinks; Laser modes; Optical arrays; Optical design; Power generation; Power lasers; Semiconductor laser arrays; Solid lasers; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Laser Conference, 2004. Conference Digest. 2004 IEEE 19th International
  • Conference_Location
    Matsue-shi
  • Print_ISBN
    0-7803-8627-2
  • Type

    conf

  • DOI
    10.1109/ISLC.2004.1382764
  • Filename
    1382764
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2355217