• DocumentCode
    2355376
  • Title

    Author index

  • fYear
    1993
  • fDate
    27-29 Oct. 1993
  • Firstpage
    335
  • Lastpage
    336
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
  • Conference_Location
    Venice, Italy
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-3502-9
  • Type

    conf

  • DOI
    10.1109/DFTVS.1993.595830
  • Filename
    595830