Title :
Design and modeling challenges for DDR II memory subsystems
Author :
Wirick, A. ; Ulrich, S. ; Pham, N. ; Cases, M. ; de Araujo, D.N.
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
This paper describes the electrical packaging challenges, design issues, and design solutions for source-synchronous DDR II memory subsystems utilizing the double data rate (DDR) timing protocols. Major design and modeling issues are discussed, such as crosstalk, delay skew, impedance control and inter-symbol interference. The timing and jitter budgets, and the noise margin allocation for the various components of the optimization equations are discussed in conjunction with their associated design control techniques. A novel termination technique is discussed that allows for maximum memory capacity per channel at a given data rate.
Keywords :
circuit noise; circuit optimisation; crosstalk; intersymbol interference; jitter; memory cards; printed circuit design; system buses; timing; DDR II memory interface; DDR II memory subsystems; crosstalk; delay skew; double data rate timing protocols; electrical packaging; impedance control; inter-symbol interference; jitter budget; maximum channel memory capacity; noise margin allocation; optimization equations; source-synchronous memory subsystems; termination techniques; timing budget; Channel capacity; Crosstalk; Delay; Design optimization; Equations; Impedance; Interference; Packaging; Protocols; Timing jitter;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2003
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-8128-9
DOI :
10.1109/EPEP.2003.1250038