Title : 
Design and modeling challenges for DDR II memory subsystems
         
        
            Author : 
Wirick, A. ; Ulrich, S. ; Pham, N. ; Cases, M. ; de Araujo, D.N.
         
        
            Author_Institution : 
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
         
        
        
        
        
        
            Abstract : 
This paper describes the electrical packaging challenges, design issues, and design solutions for source-synchronous DDR II memory subsystems utilizing the double data rate (DDR) timing protocols. Major design and modeling issues are discussed, such as crosstalk, delay skew, impedance control and inter-symbol interference. The timing and jitter budgets, and the noise margin allocation for the various components of the optimization equations are discussed in conjunction with their associated design control techniques. A novel termination technique is discussed that allows for maximum memory capacity per channel at a given data rate.
         
        
            Keywords : 
circuit noise; circuit optimisation; crosstalk; intersymbol interference; jitter; memory cards; printed circuit design; system buses; timing; DDR II memory interface; DDR II memory subsystems; crosstalk; delay skew; double data rate timing protocols; electrical packaging; impedance control; inter-symbol interference; jitter budget; maximum channel memory capacity; noise margin allocation; optimization equations; source-synchronous memory subsystems; termination techniques; timing budget; Channel capacity; Crosstalk; Delay; Design optimization; Equations; Impedance; Interference; Packaging; Protocols; Timing jitter;
         
        
        
        
            Conference_Titel : 
Electrical Performance of Electronic Packaging, 2003
         
        
            Conference_Location : 
Princeton, NJ, USA
         
        
            Print_ISBN : 
0-7803-8128-9
         
        
        
            DOI : 
10.1109/EPEP.2003.1250038