DocumentCode
235557
Title
Large low-CTE glass package-to-PCB interconnections with solder strain-relief using polymer collars
Author
Menezes, Gary ; Smet, Vanessa ; Kobayashi, Masato ; Sundaram, Venky ; Raj, P. Markondeya ; Tummala, Rao
Author_Institution
3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
1959
Lastpage
1964
Abstract
This paper reports the use of circumferential polymer collars as a strain-relief mechanism to improve the fatigue life of low-CTE package-to-PCB solder interconnections, while preserving SMT-compatibility and reworkability. Acting as a partial underfill, the polymer-collar serves to block shear deformation at the solder-package interface, and redistributes the load to reduce the overall plastic strain concentration in the solders. It also suppresses failure initiation from defective surface sites and, thus further enhances reliability. Ultra-thin glass 100μm interposers were fabricated in 18.4 mm × 18.4 mm size to model, design and demonstrate the reliability enhancement with the polymer-collar approach. The detailed interposer design and fabrication process with laminated dielectric and metallization layers on both sides is presented. A new class of epoxies with low modulus, without the incorporation of silica fillers, was used to act as the polymer collars. The polymer collars are formed by spin-coating with an optimized thickness to provide the best compromise between the effective strain relief and reworkability. Board-level assembly was performed using standard SMT processes for glass interposers with and without polymer collars. Thermal cycling reliability testing (-40°C to 125°C) of interposers, assembled on PCBs with and without polymer collars for various thicknesses of the collar was performed.
Keywords
chip scale packaging; metallisation; solders; board level assembly; fatigue life; laminated dielectric layers; low CTE glass package to PCB interconnections; metallization layers; plastic strain concentration; polymer collars; solder package interface; solder strain relief; spin coating; thermal cycling reliability testing; Assembly; Glass; Polymers; Reliability; Strain; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897571
Filename
6897571
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