DocumentCode
2355741
Title
A CAD methodology for the characterization of wide on-chip buses
Author
Elfadel, I.M. ; Deutsch, A. ; Kopcsay, G. ; Rubin, B. ; Smith, H.
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2003
fDate
27-29 Oct. 2003
Firstpage
313
Lastpage
316
Abstract
In this paper, we describe a CAD methodology for the full electrical characterization of high-performance, on-chip data buses. The goal of this methodology is to allow the accurate modeling and analysis of wide, on-chip data buses as early as possible in the design cycle. The modeling is based on a manufacturing (rather than design-manual) description of the back-end-of-the-line (BEOL) cross section of a given technology and on a full yet contained description of the power-ground mesh in which the data-bus is embedded. One major aspect of the resulting electrical models is that they allow the designer to evaluate the wide bus from the three viewpoints of signal timing, crosstalk (both inductive and capacitive), and common-mode signal integrity. Another major aspect is that they take into account such important high-frequency phenomena as the dependence of the current return-path resistance on frequencies. The CAD methodology described in this paper has been extensively correlated with on-chip hardware measurements.
Keywords
SPICE; circuit CAD; circuit layout CAD; circuit simulation; crosstalk; integrated circuit layout; microprocessor chips; system buses; CAD methodology; PowerSpice simulation; accurate modeling; back-end-of-the-line cross section; common-mode signal integrity; crosstalk; design cycle; full electrical characterization; microprocessor chip; power-ground mesh; signal timing; wide on-chip data buses; Crosstalk; Data buses; Design automation; Electric resistance; Electrical resistance measurement; Frequency; Hardware; Signal design; Timing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2003
Conference_Location
Princeton, NJ, USA
Print_ISBN
0-7803-8128-9
Type
conf
DOI
10.1109/EPEP.2003.1250057
Filename
1250057
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