• DocumentCode
    2355741
  • Title

    A CAD methodology for the characterization of wide on-chip buses

  • Author

    Elfadel, I.M. ; Deutsch, A. ; Kopcsay, G. ; Rubin, B. ; Smith, H.

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2003
  • fDate
    27-29 Oct. 2003
  • Firstpage
    313
  • Lastpage
    316
  • Abstract
    In this paper, we describe a CAD methodology for the full electrical characterization of high-performance, on-chip data buses. The goal of this methodology is to allow the accurate modeling and analysis of wide, on-chip data buses as early as possible in the design cycle. The modeling is based on a manufacturing (rather than design-manual) description of the back-end-of-the-line (BEOL) cross section of a given technology and on a full yet contained description of the power-ground mesh in which the data-bus is embedded. One major aspect of the resulting electrical models is that they allow the designer to evaluate the wide bus from the three viewpoints of signal timing, crosstalk (both inductive and capacitive), and common-mode signal integrity. Another major aspect is that they take into account such important high-frequency phenomena as the dependence of the current return-path resistance on frequencies. The CAD methodology described in this paper has been extensively correlated with on-chip hardware measurements.
  • Keywords
    SPICE; circuit CAD; circuit layout CAD; circuit simulation; crosstalk; integrated circuit layout; microprocessor chips; system buses; CAD methodology; PowerSpice simulation; accurate modeling; back-end-of-the-line cross section; common-mode signal integrity; crosstalk; design cycle; full electrical characterization; microprocessor chip; power-ground mesh; signal timing; wide on-chip data buses; Crosstalk; Data buses; Design automation; Electric resistance; Electrical resistance measurement; Frequency; Hardware; Signal design; Timing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2003
  • Conference_Location
    Princeton, NJ, USA
  • Print_ISBN
    0-7803-8128-9
  • Type

    conf

  • DOI
    10.1109/EPEP.2003.1250057
  • Filename
    1250057