DocumentCode :
2355759
Title :
An efficient pre-layout on-chip inductance noise modeling tool for bus design
Author :
Mazumder, Mohiuddin ; Bohnke, Ronald ; Husain, Asim ; Grannes, Dean ; Chiprout, Eli ; Sun, Lei ; Menon, Satish ; Eells, Jarod ; Dai, Changhong
Author_Institution :
Technol. CAD, Santa Clara, CA, USA
fYear :
2003
fDate :
27-29 Oct. 2003
Firstpage :
317
Lastpage :
320
Abstract :
On-chip inductance noise is becoming an increasingly important part of the total noise, particularly for global on-chip interconnects, because of faster transistor speeds and higher drive currents. An efficient pre-layout tool has been developed for accurate analysis of high frequency inductance effects on bus design. Since the return loop for inductance is not known a priori, a novel technique has been developed for fast determination of the inductance extraction window size to include all significant couplings and a sufficient number of power/ground return conductors. In addition, an algorithm has been developed for worst-case vector generation to estimate worst-case peak noise. The tool includes a methodology to determine the impact of power supply noise on bus crosstalk noise. It integrates RLC extraction, netlist generation, automatic worst-case vector generation, transient simulation, optimization, and post-processing of the simulated results to calculate noise, delay, and other signal integrity metrics. We demonstrate its application on optimal bus design by a microprocessor design group.
Keywords :
RLC circuits; circuit CAD; circuit optimisation; circuit simulation; crosstalk; inductance; integrated circuit modelling; microprocessor chips; system buses; RLC extraction; bus crosstalk noise; bus design; efficient pre-layout tool; global on-chip interconnects; high frequency inductance effects; inductance noise modeling tool; microprocessor design; netlist generation; on-chip inductance noise; optimization; power supply noise; signal integrity metrics; transient simulation; worst-case peak noise; worst-case vector generation; Circuit noise; Circuit simulation; Conductors; Design automation; Driver circuits; Frequency; Inductance; Noise figure; Noise generators; RLC circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2003
Conference_Location :
Princeton, NJ, USA
Print_ISBN :
0-7803-8128-9
Type :
conf
DOI :
10.1109/EPEP.2003.1250058
Filename :
1250058
Link To Document :
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