DocumentCode
2355890
Title
Non desituctive measurements for analyzing power semiconductor devices
Author
Palmer, P.H. ; Johnson, C.M.
Author_Institution
Cambridge University
fYear
1992
fDate
1992
Firstpage
8
Lastpage
14
Keywords
Anodes; Cathodes; Circuit testing; Coils; Magnetic field measurement; Power measurement; Power semiconductor devices; Production; Semiconductor device measurement; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
Type
conf
DOI
10.1109/ISPSD.1992.991229
Filename
991229
Link To Document