DocumentCode
2355903
Title
Statistical approach to the EMI modeling of large ASICs by a single noise-current source
Author
Antonini, G. ; Drewniak, J.L. ; Leone, M. ; Orlandi, A. ; Ricchiuti, V.
Author_Institution
Dept. of Electr. Eng., L´´Aquila Univ., Italy
fYear
2003
fDate
27-29 Oct. 2003
Firstpage
345
Lastpage
348
Abstract
Large and complex ASICs are source of propagating noise inside the powerbus planes. A lumped noise source model is proposed and validated by means of a statistics based method.
Keywords
application specific integrated circuits; electromagnetic interference; frequency response; integrated circuit modelling; integrated circuit noise; EMI modeling; cavity-resonator model; fast transient current; frequency response; large complex ASIC; lumped noise source model; power supplying pins; powerbus planes; propagating noise; single noise-current source; statistics based method; Application specific integrated circuits; Dielectric losses; Electromagnetic interference; Electromagnetic transients; Integrated circuit noise; Noise generators; Pins; Power supplies; Switching circuits; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2003
Conference_Location
Princeton, NJ, USA
Print_ISBN
0-7803-8128-9
Type
conf
DOI
10.1109/EPEP.2003.1250065
Filename
1250065
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