DocumentCode :
2356167
Title :
P2P-6 Trench-Isolated CMUT Arrays with a Supporting Frame
Author :
Zhuang, Xuefeng ; Lin, Der-Song ; Ergun, A. Sanli ; Oralka, Omer ; Khuri-Yakub, Butrus T.
Author_Institution :
E. L. Ginzton Lab., Stanford Univ., CA
fYear :
2006
fDate :
2-6 Oct. 2006
Firstpage :
1955
Lastpage :
1958
Abstract :
We present a trench-isolated CMUT process with a supporting mesh frame for a fully populated 2D array. In this process, the CMUT array is built on a silicon-on-insulator (SOI) wafer. Electrical interconnections to array elements are provided through the highly conductive silicon substrate. Neighboring array elements are separated from one another by trenches on both the device layer and the bulk silicon. A mechanically supporting frame is designed as a mesh structure between the silicon pillars providing electrical connections to the individual elements. Like the frameless trench isolation process, the framed trench isolation is compatible with both wafer-bonded and surface-micromachined CMUTs. In addition, this process eliminates the need for attaching the device wafer to a carrier wafer for the required mechanical support during the deep trench etching and flip-chip bonding steps, which presents difficulties during the release of the carrier wafer
Keywords :
flip-chip devices; integrated circuit interconnections; isolation technology; micromechanical devices; silicon-on-insulator; ultrasonic transducer arrays; SOI wafer; capacitive micromachined ultrasonic transducers; deep trench etching; flip-chip bonding; framed trench isolation process; silicon-on-insulator wafer; surface-micromachined CMUT; trench-isolated CMUT arrays; wafer-bonded CMUT; Biomembranes; Conducting materials; Electrodes; Laboratories; Micromachining; Parasitic capacitance; Silicon; Sputter etching; Testing; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
ISSN :
1051-0117
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2006.494
Filename :
4152350
Link To Document :
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