• DocumentCode
    2356167
  • Title

    P2P-6 Trench-Isolated CMUT Arrays with a Supporting Frame

  • Author

    Zhuang, Xuefeng ; Lin, Der-Song ; Ergun, A. Sanli ; Oralka, Omer ; Khuri-Yakub, Butrus T.

  • Author_Institution
    E. L. Ginzton Lab., Stanford Univ., CA
  • fYear
    2006
  • fDate
    2-6 Oct. 2006
  • Firstpage
    1955
  • Lastpage
    1958
  • Abstract
    We present a trench-isolated CMUT process with a supporting mesh frame for a fully populated 2D array. In this process, the CMUT array is built on a silicon-on-insulator (SOI) wafer. Electrical interconnections to array elements are provided through the highly conductive silicon substrate. Neighboring array elements are separated from one another by trenches on both the device layer and the bulk silicon. A mechanically supporting frame is designed as a mesh structure between the silicon pillars providing electrical connections to the individual elements. Like the frameless trench isolation process, the framed trench isolation is compatible with both wafer-bonded and surface-micromachined CMUTs. In addition, this process eliminates the need for attaching the device wafer to a carrier wafer for the required mechanical support during the deep trench etching and flip-chip bonding steps, which presents difficulties during the release of the carrier wafer
  • Keywords
    flip-chip devices; integrated circuit interconnections; isolation technology; micromechanical devices; silicon-on-insulator; ultrasonic transducer arrays; SOI wafer; capacitive micromachined ultrasonic transducers; deep trench etching; flip-chip bonding; framed trench isolation process; silicon-on-insulator wafer; surface-micromachined CMUT; trench-isolated CMUT arrays; wafer-bonded CMUT; Biomembranes; Conducting materials; Electrodes; Laboratories; Micromachining; Parasitic capacitance; Silicon; Sputter etching; Testing; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2006. IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1051-0117
  • Print_ISBN
    1-4244-0201-8
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2006.494
  • Filename
    4152350