• DocumentCode
    2356283
  • Title

    ESD laboratory for power electronics students

  • Author

    Kugler, F. ; Albach, M. ; Schuh, S. ; Kuebrich, D.

  • Author_Institution
    Erlangen Nuremberg Univ.
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Abstract
    Since the usage of microelectronic components and IC´s in electronic systems is growing year by year and reliability is always an issue, the designer has to be aware of possible failures of the components. The ESD (electrostatic discharge) phenomenon arouses more and more interest as these parts are sensitive to short time over voltages. Simulations to predict the effect of ESD in the actual power electronics circuitry are not possible as sufficient models for the components and the complete circuit configuration are not available. Experiments with ESD in conjunction with power electronic devices should make students aware of possible impacts of ESD pulses and methods to protect devices and circuitry. In this paper four experiments together with simple test circuits are presented, which show different aspects of ESD stress like the typical current and voltage wave forms of ESD pulses, system malfunction, pre deterioration and total damage of components
  • Keywords
    circuit testing; electronic engineering education; electrostatic discharge; power electronics; power engineering education; ESD laboratory; circuit protection; circuit testing; electronic systems; electrostatic discharge; microelectronic components; overvoltages; power electronics circuitry; power electronics students; system malfunction; Circuit simulation; Circuit testing; Electrostatic discharge; Laboratories; Microelectronics; Power electronics; Power system reliability; Predictive models; Pulse circuits; Voltage control; EMC/EMI; Education methodology; Education tool; MOSFET; Teaching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications, 2005 European Conference on
  • Conference_Location
    Dresden
  • Print_ISBN
    90-75815-09-3
  • Type

    conf

  • DOI
    10.1109/EPE.2005.219280
  • Filename
    1665470