Title :
3DSDM: A 3 data-source diagnostic method
Author :
Hariri, Y. ; Thibeault, C.
Author_Institution :
Electr. Eng. Dept., Ecole de technologie superieure, Montreal, Que., Canada
Abstract :
The goal of this paper is to present a diagnosis method for bridging faults combining three different data sources: IDDQ measurements, logical behavior and layout parasitic capacitances. The resulting hybrid method constitutes a significant improvement over an existing one based on probabilistic signatures. Combining these data contributes to reduce the number of potential fault sites to consider in the diagnosis process, and therefore accelerate this process. Simulation results show that the number of potential bridging fault sites is reduced from 0.5N(N-1) to less than N, where N is the number of nodes in the circuit under test.
Keywords :
capacitance; circuit simulation; failure analysis; fault diagnosis; integrated circuit testing; integrated circuit yield; leakage currents; probability; 3DSDM; IDDQ measurements; bridging fault diagnosis method; circuit nodes; circuit under test; data sources; hybrid method; layout parasitic capacitances; logical behavior; potential bridging fault sites; probabilistic signatures; simulation; three-data-source diagnostic method; Bridge circuits; Capacitance measurement; Circuit faults; Circuit testing; Data mining; Electric variables measurement; Failure analysis; Fault diagnosis; Histograms; Parasitic capacitance;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250102
