Title : 
A new modeling and gate driver design of SI-Thyristor using by 2-port network
         
        
            Author : 
Kim, Bong Seong ; Park, Jeong-Ho ; Ko, Kwang-Cheol
         
        
            Author_Institution : 
Dept. of Electr. Eng., Hanyang Univ., Seoul, South Korea
         
        
        
        
        
        
            Abstract : 
It is expected that Static Induction Thyristor (SI-Thyrsitor) has a great potential to substitute thyristor based power semiconductors on high voltage industrial field because of its faster turn-on time, operating frequency, higher di/dt and dV/dt, and comparatively higher reverse voltage endurance than the power semiconductors. However, due to its thyristor-based structure, the direct switching current commutation between the main body and the gate layer in the SI-Thyristor makes high voltage with fast operating frequency difficult. Thus, to maximize faster turn-on transient time with gate delay time in the SI-Thyristor, it is proceeded 2 port circuit analysis which is based on the transient turn-on switching experiment while switching conditions which indicates gate voltage waveform with dead time modulation, amplitude of applied high voltage across anode to cathode.
         
        
            Keywords : 
commutation; driver circuits; power semiconductor switches; pulsed power switches; thyristors; waveform analysis; 2-port circuit analysis; SI-thyristor; dead time modulation; direct switching current commutation; gate driver design; gate voltage waveform; industrial field; power semiconductors; static induction thyristor; transient turn-on switching; Circuit analysis; Driver circuits; Impedance; Logic gates; Switches; Thyristors; Transient analysis; 2port circuit analysis; SI-Thyristor; gate driver;
         
        
        
        
            Conference_Titel : 
Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
         
        
            Conference_Location : 
Atlanta, GA
         
        
            Print_ISBN : 
978-1-4244-7131-7
         
        
        
            DOI : 
10.1109/IPMHVC.2010.5958363