Title :
Array codes correcting a cluster of unidirectional errors for two-dimensional matrix symbols [identification technology]
Author :
Kaneko, Haruhiko ; Fujiwara, Eiji
Author_Institution :
Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol., Japan
Abstract :
This paper proposes two-dimensional unidirectional clustered error correcting codes suitable for high-density two-dimensional matrix symbols. These codes are capable of correcting unidirectional errors confined in a rectangle having lm rows and ln columns. Evaluation shows that the proposed codes have smaller number of check bits than the existing codes.
Keywords :
error correction codes; identification technology; parity check codes; residue codes; arithmetic residue checks; array codes; check bits; clustered error correcting codes; high-density 2D matrix symbols; identification technology; parity checks; unidirectional error cluster; Arithmetic; Computer errors; Error correction; Error correction codes; Information science; Parity check codes; Plastics; Postal services;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250118
