• DocumentCode
    2356651
  • Title

    Array codes correcting a cluster of unidirectional errors for two-dimensional matrix symbols [identification technology]

  • Author

    Kaneko, Haruhiko ; Fujiwara, Eiji

  • Author_Institution
    Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol., Japan
  • fYear
    2003
  • fDate
    3-5 Nov. 2003
  • Firstpage
    242
  • Lastpage
    249
  • Abstract
    This paper proposes two-dimensional unidirectional clustered error correcting codes suitable for high-density two-dimensional matrix symbols. These codes are capable of correcting unidirectional errors confined in a rectangle having lm rows and ln columns. Evaluation shows that the proposed codes have smaller number of check bits than the existing codes.
  • Keywords
    error correction codes; identification technology; parity check codes; residue codes; arithmetic residue checks; array codes; check bits; clustered error correcting codes; high-density 2D matrix symbols; identification technology; parity checks; unidirectional error cluster; Arithmetic; Computer errors; Error correction; Error correction codes; Information science; Parity check codes; Plastics; Postal services;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2042-1
  • Type

    conf

  • DOI
    10.1109/DFTVS.2003.1250118
  • Filename
    1250118
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2356651