• DocumentCode
    235676
  • Title

    Modeling and analysis of frequency shift of MEMS gyroscope subjected to temperature change

  • Author

    Weihui Wang ; Sheng Liu ; Zhang Luo ; Ming Wen ; Qiang Dan ; Man Yu ; Yong Xu ; Xin Wu

  • Author_Institution
    Sch. of Mech. Sci. & Eng., Huazhong Univ. of Sci & Tech, Wuhan, China
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    2245
  • Lastpage
    2248
  • Abstract
    The mechanism of resonant frequency shift of MEMS gyroscope subjected to environment temperature change was investigated comprehensively in this paper, and its computational model was set up based on certain assumptions. Taking the structure of MEMS gyroscope as an example using the finite element method, firstly, the authors derived the simplified M-C-K dynamic model. Then, thermal stress and the thermal deformation of the model were calculated within temperature range from -40°Cto 120°C, and the regions of maximum value of thermal stress and thermal deformation were selected in the regions between anchors and driving spring beams. Finally, the analysis of modes was implemented under varying temperature ranging from -40°C to 120°C, and the relation between resonant frequency shift and temperature change was given at the reference temperature of 20°C. The results showed that the driving resonant frequency decreased while the resonant sensing frequency fluctuated in certain value when the environment temperature increased, which indicated that frequency shift was greatly dependent on thermal stress of the driving spring beams that suspended the driving comb structure.
  • Keywords
    deformation; finite element analysis; gyroscopes; micromechanical devices; thermal stresses; MEMS gyroscope; anchors; driving comb structure; driving spring beams; environment temperature change; finite element method; resonant frequency shift; resonant sensing frequency; simplified M-C-K dynamic model; temperature -40 degC to 120 degC; thermal deformation; thermal stress; Gyroscopes; Micromechanical devices; Resonant frequency; Stress; Temperature; Temperature sensors; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897616
  • Filename
    6897616