DocumentCode
2356768
Title
Optimization of 500V, P-channel VDMOS-LIGBT transistors
Author
Parthasarathy, V. ; Chow, T.P.
Author_Institution
Rensselaer Polytechnic Institute
fYear
1992
fDate
1992
Firstpage
244
Lastpage
245
Keywords
Bipolar transistors; Charge carrier lifetime; Charge carrier processes; Conductivity; Doping; Fingers; Insulated gate bipolar transistors; MOSFET circuits; Particle measurements; Turning;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
Type
conf
DOI
10.1109/ISPSD.1992.991277
Filename
991277
Link To Document