Title :
Thermal management of high performance microprocessors in burn-in environment
Author :
Vassighi, Arman ; Semenov, Oleg ; Sachdev, Manoj ; Keshavarzi, Ali
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Abstract :
In deep sub-micron CMOS technologies, increased standby current in high performance processors results in increased junction temperature. This elevated temperature has a positive feedback on the standby current. If the temperature is not controlled, it may lead to thermal runaway. In this paper we investigate the thermal management of high performance chips in the burn-in environment.
Keywords :
CMOS integrated circuits; feedback; integrated circuit testing; leakage currents; microprocessor chips; thermal analysis; thermal stresses; CMOS; burn-in environment; burn-in ovens; high performance microprocessors; junction temperature estimation; junction temperature increase; junction to ambient thermal resistance; leakage current; standby current positive feedback; thermal management; thermal runaway; CMOS technology; Degradation; Environmental management; Leakage current; Microprocessors; Stress; Temperature; Thermal management; Thermal resistance; Threshold voltage;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250126
