• DocumentCode
    2356793
  • Title

    Hybrid packaging technique for high power density circuit

  • Author

    Nguyen, Nguyen Binh ; Jones, Franklin B.

  • Author_Institution
    Westinghouse Electronic System Group, Baltimore, MD, USA
  • fYear
    1991
  • fDate
    12-14 Feb 1991
  • Firstpage
    105
  • Lastpage
    109
  • Abstract
    Downsizing or miniaturizing power circuits for the 1990´s power conversion technologies requires high and very high power density (greater than 100 watt/in3) packaging capability. Among different packaging techniques, the hybrid packaging technique is preferred for many applications because it has a good reliability history. This technique utilizes newly developed processes and materials such as direct bonded copper and diamond coated substrates to significantly improve thermal management and achieve optimal thermal resistance (less than 0.4°C/watt). A 124 watt/cm2 (800 watt/in2) power density hybrid packaging example is presented here. The results of thermal design and evaluation of this hybrid are discussed
  • Keywords
    circuit layout; hybrid integrated circuits; power convertors; power integrated circuits; thermal resistance; C; MCT switch hybrid; diamond coated substrates; direct bonded Cu; high power density circuit; hybrid packaging technique; optimal thermal resistance; power conversion technologies; reliability; thermal design; thermal management; Bonding; Copper; Electronic packaging thermal management; Power conversion; Power dissipation; Switches; Switching circuits; Temperature; Thermal management; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1991. SEMI-THERM VII. Proceedings., Seventh Annual IEEE
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    0-87942-664-0
  • Type

    conf

  • DOI
    10.1109/STHERM.1991.152922
  • Filename
    152922