Title :
Fault tolerant multi-layer neural networks with GA training
Author :
Sugawara, Eiko ; Fukushi, Masaru ; Horiguchi, Susumu
Author_Institution :
Graduate Sch. of Inf. Sci., JAIST, Ishikawa, Japan
Abstract :
This paper addresses a fault tolerant architecture of multi-layer neural networks with a genetic algorithm scheme. For large scale neural networks, implemented in a single chip or silicon wafer, it is necessary to develop self-recovery mechanisms that can automatically recover faults without a host computer. In this paper, we propose fault tolerant multi-layer neural networks employing both hardware redundancy and weight retraining in order to realise self-recovering neural networks. The main advantages of our architecture are low hardware cost for adding redundant neurons and fast training by a genetic algorithm implemented in hardware. A prototype system is implemented on a field programmable gate array to show the possibility of self-recovering neural networks.
Keywords :
fault tolerance; field programmable gate arrays; genetic algorithms; learning (artificial intelligence); neural nets; redundancy; system recovery; FPGA; GA training; fault tolerance; fault tolerant neural networks; genetic algorithms; hardware redundancy; multilayer neural networks; redundant neurons; self-recovering neural networks; self-recovery mechanisms; weight retraining; Computer architecture; Computer networks; Fault tolerance; Genetic algorithms; Large-scale systems; Multi-layer neural network; Neural network hardware; Neural networks; Redundancy; Silicon;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250128