Title :
Failure in GTO circuits due to the change in recovery characteristic of snubber diodes
Author :
Hoban, P.T. ; Carreira, M. ; Shammas, N.Y.A.
Author_Institution :
Staffordshire Polytechnic
Keywords :
Capacitance measurement; Circuit synthesis; Circuit testing; Diodes; Equations; Frequency; Inductance; Manufacturing; Snubbers; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on
DOI :
10.1109/ISPSD.1992.991281
