Failure in GTO circuits due to the change in recovery characteristic of snubber diodes

Author

Hoban, P.T. ; Carreira, M. ; Shammas, N.Y.A.

Author_Institution

Staffordshire Polytechnic

fYear

1992

fDate

1992

Firstpage

252

Lastpage

253

Keywords

Capacitance measurement; Circuit synthesis; Circuit testing; Diodes; Equations; Frequency; Inductance; Manufacturing; Snubbers; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Semiconductor Devices and ICs, 1992. ISPSD '92. Proceedings of the 4th International Symposium on

Type

DOI

10.1109/ISPSD.1992.991281

Filename

991281

Link To Document