DocumentCode :
2356870
Title :
An FFT approximation technique suitable for on-chip generation and analysis of sinusoidal signals
Author :
Emmert, John M. ; Cheatham, Jason A. ; Jagannathan, Badhri ; Umarani, Sandeep
Author_Institution :
Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA
fYear :
2003
fDate :
3-5 Nov. 2003
Firstpage :
361
Lastpage :
368
Abstract :
Signal generation and analysis are an important part of BIST for analog and mixed-signal systems. An accurate analysis of the spectral content of signals produced by analog components can be accomplished with a digital implementation of a fast Fourier transform (FFT) algorithm. In the past, size and speed have limited the application of such a technique to off-chip test equipment or DSP chips (primarily due to the number of multiplication operations). In this paper, we present an FFT approximation technique suitable for on-chip spectral BIST signal generation and analysis. For signal generation, we show that the noise produced by the approximation technique is under 24.74 dB for a 256 point FFT with a 32 point approximate kernel. For signal analysis, we show that the instantaneous dynamic range (IDR) for the approximation technique is under 21.80 dB for a 256 point FFT with a 32 point approximate kernel. Our techniques have been implemented and demonstrated on a Xilinx Virtex-II FPGA using an off-chip ADC and DAC, and we are currently implementing the technique on an ASIC using a 0.13 μm SiGe process for 2-16 GHz applications.
Keywords :
built-in self test; fast Fourier transforms; field programmable gate arrays; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; signal generators; spectral analysis; ADC; BIST; DAC; FFT approximation technique; FPGA; IDR; analog systems; approximate kernel; approximation technique noise; fast Fourier transform; instantaneous dynamic range; mixed-signal systems; on-chip sinusoidal signal generation; on-chip sinusoidal signal spectral analysis; Algorithm design and analysis; Built-in self-test; Digital signal processing chips; Fast Fourier transforms; Kernel; Noise generators; Signal analysis; Signal generators; Spectral analysis; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2042-1
Type :
conf
DOI :
10.1109/DFTVS.2003.1250132
Filename :
1250132
Link To Document :
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