• DocumentCode
    2356870
  • Title

    An FFT approximation technique suitable for on-chip generation and analysis of sinusoidal signals

  • Author

    Emmert, John M. ; Cheatham, Jason A. ; Jagannathan, Badhri ; Umarani, Sandeep

  • Author_Institution
    Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA
  • fYear
    2003
  • fDate
    3-5 Nov. 2003
  • Firstpage
    361
  • Lastpage
    368
  • Abstract
    Signal generation and analysis are an important part of BIST for analog and mixed-signal systems. An accurate analysis of the spectral content of signals produced by analog components can be accomplished with a digital implementation of a fast Fourier transform (FFT) algorithm. In the past, size and speed have limited the application of such a technique to off-chip test equipment or DSP chips (primarily due to the number of multiplication operations). In this paper, we present an FFT approximation technique suitable for on-chip spectral BIST signal generation and analysis. For signal generation, we show that the noise produced by the approximation technique is under 24.74 dB for a 256 point FFT with a 32 point approximate kernel. For signal analysis, we show that the instantaneous dynamic range (IDR) for the approximation technique is under 21.80 dB for a 256 point FFT with a 32 point approximate kernel. Our techniques have been implemented and demonstrated on a Xilinx Virtex-II FPGA using an off-chip ADC and DAC, and we are currently implementing the technique on an ASIC using a 0.13 μm SiGe process for 2-16 GHz applications.
  • Keywords
    built-in self test; fast Fourier transforms; field programmable gate arrays; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; signal generators; spectral analysis; ADC; BIST; DAC; FFT approximation technique; FPGA; IDR; analog systems; approximate kernel; approximation technique noise; fast Fourier transform; instantaneous dynamic range; mixed-signal systems; on-chip sinusoidal signal generation; on-chip sinusoidal signal spectral analysis; Algorithm design and analysis; Built-in self-test; Digital signal processing chips; Fast Fourier transforms; Kernel; Noise generators; Signal analysis; Signal generators; Spectral analysis; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2042-1
  • Type

    conf

  • DOI
    10.1109/DFTVS.2003.1250132
  • Filename
    1250132