Title :
Efficiency of transient bit-flips detection by software means: a complete study
Author :
Nicolescu, B. ; Peronnard, P. ; Velazco, R. ; Savaria, Y.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
This-paper characterizes the effectiveness of an error detection technique that addresses transient faults induced by the environment (radiation, EMC) in processor-based architectures. Experimental results obtained from fault injection sessions performed on two platforms built around a 32-bit digital signal processor and an 8-bit microcontroller, provide objective figures about the efficiency of the proposed approach.
Keywords :
digital signal processing chips; error detection; fault tolerant computing; integrated circuit reliability; integrated circuit testing; microcontrollers; safety-critical software; transient response; 32 bit; 8 bit; EMC induced faults; SEU; digital signal processor; environment induced transient faults; fault injection; fault tolerance; microcontroller; processor-based architectures; radiation induced faults; safety-critical applications; single event upset; software error detection technique; transient bit-flip detection efficiency; Application software; CMOS technology; Circuit faults; Digital signal processors; Electromagnetic radiation; Electromagnetic transients; Fault detection; Fault tolerance; Microcontrollers; Radiation detectors;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250134
