DocumentCode
2356990
Title
Surface charge accumulation on the cone-type insulator under DC voltage
Author
Wang, Q. ; Zhang, G.X. ; Wang, X.X. ; Wang, B.
Author_Institution
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
fYear
2010
fDate
23-27 May 2010
Firstpage
430
Lastpage
433
Abstract
Surface charge accumulation on cone-type insulators is a remarkable phenomenon in Gas Insulated Line (GIL), especially under DC voltage. It may lead to a considerable reduction of the flashover voltage of insulators. For this respect, this paper focuses on the surface charge distribution on the real insulator after applying DC voltage. In order to study this phenomenon, a set of device for measuring surface voltages on the insulator is designed, base on the electrostatic probe method. After applying different DC voltage amplitudes to the cone-type insulator, the surface voltage distributions, which reflect charge distributions to some extent, are measured by an electrostatic probe in SF6 gas. Despite of the axial symmetry of the insulator, the measurement results show that the charge distribution is nonaxisymmetrical. The negative charge accumulates mostly under positive DC voltage. On the other hand, no apparent positive charge accumulation is observed on the surface. In areas which are close to electrode, the measured voltage amplitudes are much higher than outer areas.
Keywords
SF6 insulation; flashover; gas insulated transmission lines; insulators; DC voltage amplitude; cone-type insulator; electrostatic probe method; gas insulated line; insulator axial symmetry; insulator flashover voltage distribution; nonaxisymmetrical charge distribution; positive charge accumulation; surface charge accumulation; surface charge distribution; surface voltage measurement; Charge measurement; Electrodes; Insulators; Probes; Surface charging; Voltage measurement; GIL; cone-type insulator; electrostatic probe method; measurement; surface charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Modulator and High Voltage Conference (IPMHVC), 2010 IEEE International
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-7131-7
Type
conf
DOI
10.1109/IPMHVC.2010.5958386
Filename
5958386
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